Olympus BX41 Brightfield Darkfield DIC/Nomarski Reflected and Transmitted Light Microscope LEICA ERGO LEICA Materials analysis and quality control

Materials analysis and quality control

Vertical incident light is especially suited for inspection

The Olympus SPlan 40X Phase Contrast objective (part number 1-LP154) is a high-performance Semi-Plan objective designed for the Olympus BH2 and CH2 microscope platforms

precise X-Y mechanical movement via right-hand stalk controls — enabling systematic scanning of cell culture flasks

Specification Details Light Source C-FLED LED (MNF52760) Light Guides C-FDF Dual Arm Flexible Fiber (MME49610) Arm Holder C-FIDH Articulated Arm Holder Set (MME49620) Illumination Type Incident (reflected) fiber optic LED SKU C-FLED2 Country of Origin Japan Condition New University purchase orders are accepted

Olympus BX41 Brightfield Darkfield DIC/Nomarski Reflected and Transmitted Light Microscope LEICA ERGO LEICA Materials analysis and quality controlThe Olympus BX41 Brightfield, Darkfield & DIC Nomarski Reflected and Transmitted Light Microscope is a fully configured, research grade dual mode system combining reflected light brightfield, darkfield, and DIC Nomarski with transmitted light featuring a complete five objective UM Plan FL BD set and a trinocular head with C mount for versatile materials science, industrial inspection, and biological research applications. Five UM Plan FL BD